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Wake Forest University
Center for Nanotechnology and Quantum Materials
NanoteQ
Imaging and Microanalysis Facility
Micro
Training and Certification are required to use the equipment. User workshops and classes are offered regularly and by request. Assistance and full microscopy services are also available. For access contact: carroldl@wfu.edu
image sourced online
Electron Microscopes
Scanning Probe Microscopes
JEOL JSPM 5200 Atomic Force Microscope
RHK UHV VT Scanning Tunneling Microscope
Veeco / Digital Instruments Dimension 3100 AFM
XPS - Auger
PHI 570 - RBD Scanning Auger and XPS system
X-Ray Photoelectron Spectroscopy (XPS) Surface Analysis / ESCA and Auger Electron Spectroscopy (AES)
Optical Microscopy
2 Olympus VANOX systems
1. Differential interference contrast (DIC) microscopy, aka Nomarski interference contrast (NIC).
2. Fluorescence microscopy.
Raman microscopy
Thermo Fisher Nicolet Almega XR Olympus BX51 Raman Microscope
You must schedule your use time with the scope. Remember the facility provides tips, grids, solvents, and some substrates.
Don't forget to sign in as you enter the microscopy facility. You can also check on the status of the scopes there