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jeol_jsm-6330_1154696.jpg

JEOL 6330F SEM

Electron beam energy: 0.2-30 keV,

Resolution: 1.5 nm,

Magnification: 500,000x,

3D imaging package,

 

Sputter coater and carbon coater available.

 

Energy dispersive spectrometer (EDS), X-Ray range: 0.15-30 keV Energy resolution.

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